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7#

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发表于 2011-9-22 14:04:27
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以下为 ISO2808 6A 内容
5.4.4 Method 6A — Cross-sectioning
5.4.4.1 Version 1 — By grinding
5.4.4.1.1 Apparatus and materials
5.4.4.1.1.1 Grinding and polishing machine
Apparatus which is used for producing metallographic preparations is suitable.
5.4.4.1.1.2 Embedding medium
Use a cold-setting resin that has no deleterious effect on the paint coating and gives gap-free embedding.
5.4.4.1.1.3 Grinding and polishing media
Use waterproof abrasive paper, for example 280, 400 and 600 grit, or suitable grades of diamond paste or a
similar paste.
5.4.4.1.1.4 Measuring microscope
Required is a microscope with a suitable illumination system giving optimum image contrast. The
magnification shall be chosen such that the field of vision corresponds to 1,5 to 3 times the film thickness. The
eyepiece or optoelectronic measurement device shall permit measurements to be made to an accuracy of at
least 1 μm.
5.4.4.1.2 Procedure
Embed the specimen or a representative sample of the specimen in the resin (5.4.4.1.1.2). Wet-polish the
specimen or sample using the grinding and polishing machine (5.4.4.1.1.1) along a plane normal to the
coating surface. Repeat this process with an ever-finer grade of abrasive. Measure the thickness(es) of the
exposed layer(s) using the microscope.
5.4.4.2 Version 2 — By cutting
5.4.4.2.1 Apparatus
5.4.4.2.1.1 Cutter
Required is a traversing or rotary microtome with carbide blades of suitable geometry and a holder for
clamping the specimen in place.
5.4.4.2.1.2 Measuring microscope
Required is a microscope with a suitable illumination system giving optimum image contrast. The
magnification shall be chosen such that the field of vision corresponds to 1,5 to 3 times the film thickness. The
eyepiece or optoelectronic measurement device shall permit measurements to be made to an accuracy of at
least 1 μm.
5.4.4.2.2 Procedure
Clamp the specimen or a representative sample taken from the specimen in the microtome specimen holder
and cut along a plane normal to the coating surface. Measure the thicknesses of the exposed layers using the
microscope. |
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